- Friday, December 1, 2000
- X-ray photoelectron spectroscopic measurements on glassy Ge20S80−xBix (x=0,16)
- Published at:Materials Letters, Volume 46, Issue 6, December 2000, Pages 327-331
X-ray photoelectron spectroscopy measurements have been performed on n-type Bi-modified Ge20S64Bi16 glass. The observed chemical shifts show that Bi is incorporated as a positive charged center into the matrix of Ge20S80 parent glass.
Materials Letters, Volume 46, Issue 6, December 2000, Pages 327-331