- Monday, January 1, 2007
- Published at:J. of Active and Passive Electronic Devices, Vol. 2, pp. 93–103
- The possibility of improving tribological properties of aluminum alloys using a chrome nitride coating is exploded. Thin films of CrxN1−xwere deposited on aluminum 6061 using a reactive sputtering technique in an unbalanced magnetron deposition system. The structure, composition, and morphology of the deposited thin films were characterized by using x-ray diffraction (XRD), scanning electron microscopy (SEM), electron – probe microanalysis (EPMA), and x-ray photoelectron spectroscopy (XPS).
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- Monday, January 1, 2007
- Published at:J. of Active and Passive Electronic Devices, Vol. 2, pp. 305–314
- The possibility of significantly improving the wear resistance, corrosion and friction behavior of aluminum alloys for automobile engine applications is demonstrated by using a chrome nitride (CrN) coating. Thin films of CrxN1−x were deposited on aluminum 6061 using a reactive sputtering technique in an unbalanced magnetron deposition system. The hardness and elastic modulus of the films were measured using a nanoindentation technique. A CrN film of a few micrometers thick was shown to significantly improve the wear resistance of aluminum alloy. The reduction of adhesive wear by the presence of a CrxN1−x coating on the surface of the aluminum alloy is believed to be responsible.
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- Monday, January 1, 2007
- Published at:J. of Active and Passive Electronic Devices, Vol. 2, pp. 1-9
- Thermal analysis (TA) that incorporates image analysis can be a powerful online tool for estimating degree of silicon modification in cast test samples. This work is a review of different articles, that elaborate this subject from different perspectives. The goal of the study outlined in the one of the article was on-line quantitative control of aluminum-silicon modification level using thermal analysis. The other articles examined the effect of strontium fading on the size and shape of silicon particles in the 319 aluminum alloys. Measurements of the size of silicon particles formed during solidification were used to quantity strontium fading. In the other article, the influences of strontium on the silicon modification and aluminum-copper eutectic microstructures in the 319-aluminum alloy were examined. The strontium levels considered were between 8 and 96 ppm. The goal of work discussed in the fourth article is to demonstrate the possibility to quantify and to characterize the development of Cu enriched ph
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- Wednesday, January 1, 2003
- Published at:Journal of the Islamic University of Gaza, V.ll, No.2. P 1-Pll, 2003
- In this paper, the x- ray diffraction were taken for different ratios of Ferroelectric Lead Zirconate Titanate (PZT) thin films. From this method, the (PZT) locations were defined and the (11 1) orientations were found for each film.
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- Tuesday, January 1, 2002
- Published at:An-Najah University Journal for Research - Natural Sciences (A) ISSN: 1727-2114
- Ferroelectrics lead zirconate titanate (PZT) thin films were fabricated by pulsed laser deposition on Pt coated Si substrate. The effect of oxygen partial pressure, substrate temperature and time of ablation on the film orientation and composition will be presented. It was found that highly (111) textured PZT films could be grown with careful selection of ablation conditions which are: the oxygen pressure is 300 mT, substrate temperature is 605 C and the ablation time is 16 minutes.
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